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 FOR
IMMEDIATE RELEASE
Contact: Ellen Modock
Keithley Instruments, Inc.
440-498-2746
modock_ellen@keithley.com
Keithley's Semiconductor Test Software Named One of 2008's Hottest Electronic Products
by EDN Magazine
Cleveland, Ohio - January 20, 2009 -
Keithley Instruments, Inc.
(NYSE:KEI), a leader in emerging measurement solutions, announces that its KTEI (Keithley Test Environment
Interactive) V7.1 software for the Model 4200-SCS (Semiconductor
Characterization System) has been named one of EDN magazine's Hot 100 Electronic Products of 2008. EDN's
editors compile an annual list of the year's 100 most significant electronic products, including integrated
circuits, components, computer boards, software tools, power devices,
test instruments, and more. The editors select products they consider innovative and newsworthy, representing
the best of the best of products and technologies announced during 2008.
KTEI V7.1 software
incorporates a number of innovative features and functions that broaden the capabilities of Keithley's Model
4200-CVU (Capacitance-Voltage Unit), most notably software support for characterizing high-power semiconductor
devices. This capability is useful for engineers working with automotive applications, display technology,
microelectromechanical systems (MEMS), and other high-power applications. KTEI V7.1 also adds software support for
other new functions, as well as a variety of software enhancements designed to speed and simplify testing.
Keithley's Model 4200-SCS is the most complete semiconductor characterization analyzer on the market,
making tough measurements easy and lowering the cost of test by protecting capital equipment investment. The
system replaces a variety of electrical test tools with a single, tightly integrated characterization solution and
is ideal for a wide range of applications, including semiconductor technology development, process development,
and materials research in reliability labs, materials and device research labs, and consortia, as well as any lab
needing a benchtop DC or pulse instrument. Keithley has continually enhanced the Model 4200-SCS's hardware and
software since its introduction. This commitment to ongoing system innovation assures a cost-effective upgrade
path, so users don't need to buy a new parametric analyzer because their current system is obsolete. Systems can
be upgraded cost-effectively to keep pace with the industry's evolving test needs, stretching capital investments
in the Model 4200-SCS even further.
For More Information. For more information on Keithley's
KTEI V7.1, Model 4200-SCS Semiconductor Characterization System or any of its semiconductor test solutions, visit
www.keithley.com/products/semiconductor/?mn=4200-SCS or contact the company at:
| Telephone: |
800-688-9951
440-248-0400 |
| FAX: |
440-248-6168 |
| E-mail: |
publisher@keithley.com |
| Internet: |
www.keithley.com |
| Address: |
Keithley Instruments, Inc. |
| |
28775 Aurora Road |
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Cleveland, OH 44139-1891 |
About Keithley Instruments, Inc.
With more than 60 years of measurement expertise, Keithley Instruments has
become a world leader in advanced electrical test instruments and systems from DC to RF (radio frequency). Our
products solve emerging measurement needs in production testing, process monitoring, product development, and
research. Our customers are scientists and engineers in the worldwide electronics industry involved with advanced
materials research, semiconductor device development and fabrication, and the production of end products such as
portable wireless devices. The value we provide them is a combination of precision measurement technology and a
rich understanding of their applications to improve the quality of their products and reduce their cost of test.
Products and company names listed are trademarks or trade names of their respective companies.
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